2019-06-18 23:03:04 +00:00
|
|
|
from .ssz_impl import serialize, hash_tree_root
|
2019-06-16 23:39:39 +00:00
|
|
|
from .ssz_typing import (
|
2019-06-18 23:03:04 +00:00
|
|
|
Bit, Container, List, Vector, Bytes, BytesN,
|
|
|
|
uint8, uint16, uint32, uint64, byte
|
2019-06-16 23:39:39 +00:00
|
|
|
)
|
|
|
|
|
|
|
|
import pytest
|
|
|
|
|
|
|
|
|
|
|
|
class EmptyTestStruct(Container):
|
|
|
|
pass
|
|
|
|
|
|
|
|
|
|
|
|
class SingleFieldTestStruct(Container):
|
|
|
|
A: byte
|
|
|
|
|
|
|
|
|
|
|
|
class SmallTestStruct(Container):
|
|
|
|
A: uint16
|
|
|
|
B: uint16
|
|
|
|
|
|
|
|
|
|
|
|
class FixedTestStruct(Container):
|
|
|
|
A: uint8
|
|
|
|
B: uint64
|
|
|
|
C: uint32
|
|
|
|
|
|
|
|
|
|
|
|
class VarTestStruct(Container):
|
|
|
|
A: uint16
|
|
|
|
B: List[uint16, 1024]
|
|
|
|
C: uint8
|
|
|
|
|
|
|
|
|
|
|
|
class ComplexTestStruct(Container):
|
|
|
|
A: uint16
|
|
|
|
B: List[uint16, 128]
|
|
|
|
C: uint8
|
|
|
|
D: Bytes[256]
|
|
|
|
E: VarTestStruct
|
|
|
|
F: Vector[FixedTestStruct, 4]
|
|
|
|
G: Vector[VarTestStruct, 2]
|
|
|
|
|
|
|
|
|
|
|
|
sig_test_data = [0 for i in range(96)]
|
|
|
|
for k, v in {0: 1, 32: 2, 64: 3, 95: 0xff}.items():
|
|
|
|
sig_test_data[k] = v
|
|
|
|
|
|
|
|
test_data = [
|
|
|
|
("bool F", Bit(False), "00"),
|
|
|
|
("bool T", Bit(True), "01"),
|
|
|
|
("uint8 00", uint8(0x00), "00"),
|
|
|
|
("uint8 01", uint8(0x01), "01"),
|
|
|
|
("uint8 ab", uint8(0xab), "ab"),
|
|
|
|
("uint16 0000", uint16(0x0000), "0000"),
|
|
|
|
("uint16 abcd", uint16(0xabcd), "cdab"),
|
|
|
|
("uint32 00000000", uint32(0x00000000), "00000000"),
|
|
|
|
("uint32 01234567", uint32(0x01234567), "67452301"),
|
|
|
|
("small (4567, 0123)", SmallTestStruct(A=0x4567, B=0x0123), "67452301"),
|
|
|
|
("small [4567, 0123]::2", Vector[uint16, 2](uint16(0x4567), uint16(0x0123)), "67452301"),
|
|
|
|
("uint32 01234567", uint32(0x01234567), "67452301"),
|
|
|
|
("uint64 0000000000000000", uint64(0x00000000), "0000000000000000"),
|
|
|
|
("uint64 0123456789abcdef", uint64(0x0123456789abcdef), "efcdab8967452301"),
|
|
|
|
("sig", BytesN[96](*sig_test_data),
|
|
|
|
"0100000000000000000000000000000000000000000000000000000000000000"
|
|
|
|
"0200000000000000000000000000000000000000000000000000000000000000"
|
|
|
|
"03000000000000000000000000000000000000000000000000000000000000ff"),
|
|
|
|
("emptyTestStruct", EmptyTestStruct(), ""),
|
|
|
|
("singleFieldTestStruct", SingleFieldTestStruct(A=0xab), "ab"),
|
|
|
|
("fixedTestStruct", FixedTestStruct(A=0xab, B=0xaabbccdd00112233, C=0x12345678), "ab33221100ddccbbaa78563412"),
|
|
|
|
("varTestStruct nil", VarTestStruct(A=0xabcd, C=0xff), "cdab07000000ff"),
|
|
|
|
("varTestStruct empty", VarTestStruct(A=0xabcd, B=List[uint16, 1024](), C=0xff), "cdab07000000ff"),
|
|
|
|
("varTestStruct some", VarTestStruct(A=0xabcd, B=List[uint16, 1024](1, 2, 3), C=0xff),
|
|
|
|
"cdab07000000ff010002000300"),
|
|
|
|
("complexTestStruct",
|
|
|
|
ComplexTestStruct(
|
|
|
|
A=0xaabb,
|
|
|
|
B=List[uint16, 128](0x1122, 0x3344),
|
|
|
|
C=0xff,
|
|
|
|
D=Bytes[256](b"foobar"),
|
|
|
|
E=VarTestStruct(A=0xabcd, B=List[uint16, 1024](1, 2, 3), C=0xff),
|
|
|
|
F=Vector[FixedTestStruct, 4](
|
|
|
|
FixedTestStruct(A=0xcc, B=0x4242424242424242, C=0x13371337),
|
|
|
|
FixedTestStruct(A=0xdd, B=0x3333333333333333, C=0xabcdabcd),
|
|
|
|
FixedTestStruct(A=0xee, B=0x4444444444444444, C=0x00112233),
|
|
|
|
FixedTestStruct(A=0xff, B=0x5555555555555555, C=0x44556677)),
|
|
|
|
G=Vector[VarTestStruct, 2](
|
|
|
|
VarTestStruct(A=0xabcd, B=List[uint16, 1024](1, 2, 3), C=0xff),
|
|
|
|
VarTestStruct(A=0xabcd, B=List[uint16, 1024](1, 2, 3), C=0xff)),
|
|
|
|
),
|
|
|
|
"bbaa"
|
|
|
|
"47000000" # offset of B, []uint16
|
|
|
|
"ff"
|
|
|
|
"4b000000" # offset of foobar
|
|
|
|
"51000000" # offset of E
|
|
|
|
"cc424242424242424237133713"
|
|
|
|
"dd3333333333333333cdabcdab"
|
|
|
|
"ee444444444444444433221100"
|
|
|
|
"ff555555555555555577665544"
|
|
|
|
"5e000000" # pointer to G
|
|
|
|
"22114433" # contents of B
|
|
|
|
"666f6f626172" # foobar
|
|
|
|
"cdab07000000ff010002000300" # contents of E
|
|
|
|
"08000000" "15000000" # [start G]: local offsets of [2]varTestStruct
|
|
|
|
"cdab07000000ff010002000300"
|
|
|
|
"cdab07000000ff010002000300",
|
|
|
|
)
|
|
|
|
]
|
|
|
|
|
|
|
|
|
|
|
|
@pytest.mark.parametrize("name, value, serialized", test_data)
|
|
|
|
def test_serialize(name, value, serialized):
|
|
|
|
assert serialize(value) == bytes.fromhex(serialized)
|
|
|
|
|
|
|
|
|
|
|
|
@pytest.mark.parametrize("name, value, _", test_data)
|
|
|
|
def test_hash_tree_root(name, value, _):
|
|
|
|
hash_tree_root(value)
|