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* Update release number to 124.
Github Issues:
* Fix Makefile SPECREMARK macro to work when not building in a git tree
(public issue 992).
* Ignore pname:aspectMask for unused attachments in
slink:VkSubpassDescription2KHR valid usage statements (public pull
request 1028).
* Minor markup / spelling fixes (public pull requests 1035, 1045).
Internal Issues:
* Fix markup in Valid Usage statement for slink:VkCreateFramebuffer
(internal issue 1823).
* Add a new <<synchronization-signal-operation-order, _signal operation
order_>> section to the synchronization chapter which describes in
detail the ordering guarantees provided by the API between fence and
semaphore signal operations (internal merge request 3368).
* Move generated `appendix/meta/` files into the Makefile GENERATED
directory (internal merge request 3381).
New Extensions
* `<<VK_KHR_shader_clock>>`
* `<<VK_KHR_timeline_semaphore>>`
91 lines
3.2 KiB
Plaintext
91 lines
3.2 KiB
Plaintext
include::{generated}/meta/VK_EXT_sample_locations.txt[]
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*Last Modified Date*::
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2017-08-02
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*Contributors*::
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- Mais Alnasser, AMD
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- Matthaeus G. Chajdas, AMD
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- Maciej Jesionowski, AMD
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- Daniel Rakos, AMD
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- Slawomir Grajewski, Intel
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- Jeff Bolz, NVIDIA
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- Bill Licea-Kane, Qualcomm
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This extension allows an application to modify the locations of samples
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within a pixel used in rasterization.
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Additionally, it allows applications to specify different sample locations
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for each pixel in a group of adjacent pixels, which can: increase
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antialiasing quality (particularly if a custom resolve shader is used that
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takes advantage of these different locations).
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It is common for implementations to optimize the storage of depth values by
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storing values that can: be used to reconstruct depth at each sample
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location, rather than storing separate depth values for each sample.
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For example, the depth values from a single triangle may: be represented
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using plane equations.
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When the depth value for a sample is needed, it is automatically evaluated
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at the sample location.
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Modifying the sample locations causes the reconstruction to no longer
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evaluate the same depth values as when the samples were originally
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generated, thus the depth aspect of a depth/stencil attachment must: be
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cleared before rendering to it using different sample locations.
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Some implementations may: need to evaluate depth image values while
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performing image layout transitions.
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To accommodate this, instances of the slink:VkSampleLocationsInfoEXT
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structure can: be specified for each situation where an explicit or
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automatic layout transition has to take place.
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slink:VkSampleLocationsInfoEXT can: be chained from
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slink:VkImageMemoryBarrier structures to provide sample locations for layout
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transitions performed by flink:vkCmdWaitEvents and
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flink:vkCmdPipelineBarrier calls, and
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slink:VkRenderPassSampleLocationsBeginInfoEXT can: be chained from
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slink:VkRenderPassBeginInfo to provide sample locations for layout
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transitions performed implicitly by a render pass instance.
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=== New Object Types
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None.
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=== New Enum Constants
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* Extending elink:VkImageCreateFlagBits:
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** ename:VK_IMAGE_CREATE_SAMPLE_LOCATIONS_COMPATIBLE_DEPTH_BIT_EXT
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* Extending elink:VkStructureType:
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** ename:VK_STRUCTURE_TYPE_SAMPLE_LOCATIONS_INFO_EXT
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** ename:VK_STRUCTURE_TYPE_RENDER_PASS_SAMPLE_LOCATIONS_BEGIN_INFO_EXT
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** ename:VK_STRUCTURE_TYPE_PIPELINE_SAMPLE_LOCATIONS_STATE_CREATE_INFO_EXT
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** ename:VK_STRUCTURE_TYPE_PHYSICAL_DEVICE_SAMPLE_LOCATIONS_PROPERTIES_EXT
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** ename:VK_STRUCTURE_TYPE_MULTISAMPLE_PROPERTIES_EXT
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* Extending elink:VkDynamicState:
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** ename:VK_DYNAMIC_STATE_SAMPLE_LOCATIONS_EXT
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=== New Enums
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None.
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=== New Structures
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* slink:VkSampleLocationEXT
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* slink:VkSampleLocationsInfoEXT
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* slink:VkAttachmentSampleLocationsEXT
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* slink:VkSubpassSampleLocationsEXT
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* slink:VkRenderPassSampleLocationsBeginInfoEXT
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* slink:VkPipelineSampleLocationsStateCreateInfoEXT
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* slink:VkPhysicalDeviceSampleLocationsPropertiesEXT
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* slink:VkMultisamplePropertiesEXT
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=== New Functions
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* flink:vkCmdSetSampleLocationsEXT
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* flink:vkGetPhysicalDeviceMultisamplePropertiesEXT
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=== Issues
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None.
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=== Version History
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* Revision 1, 2017-08-02 (Daniel Rakos)
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- Internal revisions
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